Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be...

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Bibliographic Details
Main Authors: Mehmet Z. Baykara, Omur E. Dagdeviren, Todd C. Schwendemann, Harry Mönig, Eric I. Altman, Udo D. Schwarz
Format: Article
Language:English
Published: Beilstein-Institut 2012-09-01
Series:Beilstein Journal of Nanotechnology
Subjects:
atomic force microscopy
force spectroscopy
NC-AFM
three-dimensional atomic force microscopy
tip asymmetry
tip elasticity
Online Access:https://doi.org/10.3762/bjnano.3.73

Internet

https://doi.org/10.3762/bjnano.3.73

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