Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
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Beilstein-Institut
2012-09-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.3.73 |
| _version_ | 1828401500774203392 |
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| author | Mehmet Z. Baykara Omur E. Dagdeviren Todd C. Schwendemann Harry Mönig Eric I. Altman Udo D. Schwarz |
| author_facet | Mehmet Z. Baykara Omur E. Dagdeviren Todd C. Schwendemann Harry Mönig Eric I. Altman Udo D. Schwarz |
| author_sort | Mehmet Z. Baykara |
| collection | DOAJ |
| description | Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be affected by piezo nonlinearities, thermal and electronic drift, tip asymmetries, and elastic deformation of the tip apex, these effects need to be considered during image interpretation.In this paper, we analyze their impact on the acquired data, compare different methods to record atomic-resolution surface force fields, and determine the approaches that suffer the least from the associated artifacts. The related discussion underscores the idea that since force fields recorded by using NC-AFM always reflect the properties of both the sample and the probe tip, efforts to reduce unwanted effects of the tip on recorded data are indispensable for the extraction of detailed information about the atomic-scale properties of the surface. |
| first_indexed | 2024-12-10T09:48:04Z |
| format | Article |
| id | doaj.art-b5e2b5742ff643dcbefd347b285b3790 |
| institution | Directory Open Access Journal |
| issn | 2190-4286 |
| language | English |
| last_indexed | 2024-12-10T09:48:04Z |
| publishDate | 2012-09-01 |
| publisher | Beilstein-Institut |
| record_format | Article |
| series | Beilstein Journal of Nanotechnology |
| spelling | doaj.art-b5e2b5742ff643dcbefd347b285b37902022-12-22T01:53:45ZengBeilstein-InstitutBeilstein Journal of Nanotechnology2190-42862012-09-013163765010.3762/bjnano.3.732190-4286-3-73Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reductionMehmet Z. Baykara0Omur E. Dagdeviren1Todd C. Schwendemann2Harry Mönig3Eric I. Altman4Udo D. Schwarz5Department of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06520, USADepartment of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06520, USAPhysics Department, Southern Connecticut State University, New Haven, CT 06515, USADepartment of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06520, USACenter for Research on Interface Structures and Phenomena (CRISP), Yale University, New Haven, CT 06520, USADepartment of Mechanical Engineering and Materials Science, Yale University, New Haven, CT 06520, USANoncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be affected by piezo nonlinearities, thermal and electronic drift, tip asymmetries, and elastic deformation of the tip apex, these effects need to be considered during image interpretation.In this paper, we analyze their impact on the acquired data, compare different methods to record atomic-resolution surface force fields, and determine the approaches that suffer the least from the associated artifacts. The related discussion underscores the idea that since force fields recorded by using NC-AFM always reflect the properties of both the sample and the probe tip, efforts to reduce unwanted effects of the tip on recorded data are indispensable for the extraction of detailed information about the atomic-scale properties of the surface.https://doi.org/10.3762/bjnano.3.73atomic force microscopyforce spectroscopyNC-AFMthree-dimensional atomic force microscopytip asymmetrytip elasticity |
| spellingShingle | Mehmet Z. Baykara Omur E. Dagdeviren Todd C. Schwendemann Harry Mönig Eric I. Altman Udo D. Schwarz Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction Beilstein Journal of Nanotechnology atomic force microscopy force spectroscopy NC-AFM three-dimensional atomic force microscopy tip asymmetry tip elasticity |
| title | Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction |
| title_full | Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction |
| title_fullStr | Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction |
| title_full_unstemmed | Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction |
| title_short | Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction |
| title_sort | probing three dimensional surface force fields with atomic resolution measurement strategies limitations and artifact reduction |
| topic | atomic force microscopy force spectroscopy NC-AFM three-dimensional atomic force microscopy tip asymmetry tip elasticity |
| url | https://doi.org/10.3762/bjnano.3.73 |
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