Recycled integrated circuit detection using reliability analysis and machine learning algorithms

Recycled integrated circuit detection using reliability analysis and machine learning algorithms

Abstract The use of counterfeit integrated circuits (ICs) in electronic products decreases its quality and lifetime. Recycled ICs can be detected by the method of aging analysis. Aging is carried out through reliability analysis with the effect of hot carrier injection and bias temperature instabili...

Full description

Bibliographic Details
Main Authors: Udaya Shankar Santhana Krishnan, Kalpana Palanisamy
Format: Article
Language:English
Published: Hindawi-IET 2021-01-01
Series:IET Computers & Digital Techniques
Subjects:
ageing
backpropagation
circuit analysis computing
differential amplifiers
hot carriers
integrated circuit modelling
Online Access:https://doi.org/10.1049/cdt2.12005

Internet

https://doi.org/10.1049/cdt2.12005

Similar Items