Stuck-at Faults Tolerance and Recovery in MLP Neural Networks Using Imperfect Emerging CNFET Technology

Stuck-at Faults Tolerance and Recovery in MLP Neural Networks Using Imperfect Emerging CNFET Technology

Devices using emerging technologies and materials with the potential to outperform their silicon counterpart are actively explored in search of ways to extend Moore’s law. Among these technologies, low dimensional channel materials (LDMs) devices, such as carbon nanotube field-effect tran...

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Bibliographic Details
Main Authors: An Qi Zhang, Amr M. S. Tosson, Dylan Ma, Ryan Fang, Lan Wei
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Journal on Exploratory Solid-State Computational Devices and Circuits
Subjects:
Carbon nanotube field-effect transistor (CNFET)
image processing
multilayer perceptron (MLP)
neural network
NeuroSim
static random access memory (SRAM)
Online Access:https://ieeexplore.ieee.org/document/10246789/

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https://ieeexplore.ieee.org/document/10246789/

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