Structure of semiconducting versus fast-ion conducting glasses in the Ag–Ge–Se system
The transition from a semiconductor to a fast-ion conductor with increasing silver content along the Agx(Ge0.25Se0.75)(100−x) tie line (0≤x≤25) was investigated on multiple length scales by employing a combination of electric force microscopy, X-ray diffraction, and neutron diffraction. The microsco...
Main Authors: | , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
The Royal Society
2018-01-01
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Series: | Royal Society Open Science |
Subjects: | |
Online Access: | https://royalsocietypublishing.org/doi/pdf/10.1098/rsos.171401 |