Advances in VLSI testing at MultiGb per second rates
Today's high performance manufacturing of digital systems requires VLSI testing at speeds of multigigabits per second (multiGbps). Testing at Gbps needs high transfer rates among channels and functional units, and requires readdressing of data format and communication within a serial mode. This...
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| Format: | Article |
| Language: | English |
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Faculty of Technical Sciences in Cacak
2005-01-01
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| Series: | Serbian Journal of Electrical Engineering |
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| Online Access: | http://www.doiserbia.nb.rs/img/doi/1451-4869/2005/1451-48690501043T.pdf |