Scanning two-grating free electron Mach-Zehnder interferometer
We demonstrate a two-grating free electron Mach-Zehnder interferometer constructed in a transmission electron microscope. A symmetric binary phase grating and a condenser lens system form two spatially separated, focused probes at the sample which can be scanned while maintaining alignment. The two...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
American Physical Society
2021-10-01
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| Series: | Physical Review Research |
| Online Access: | http://doi.org/10.1103/PhysRevResearch.3.043009 |