Atomic delocalization as a microscopic origin of two-level defects in Josephson junctions

Atomic delocalization as a microscopic origin of two-level defects in Josephson junctions

Identifying the microscopic origins of decoherence sources prevalent in Josephson junction (JJ) based circuits is central to their use as functional quantum devices. Focussing on so called ‘strongly coupled’ two-level defects, we construct a theoretical model using the atomic position of the oxygen...

Full description

Bibliographic Details
Main Authors: Timothy C DuBois, Salvy P Russo, Jared H Cole
Format: Article
Language:English
Published: IOP Publishing 2015-01-01
Series:New Journal of Physics
Subjects:
two level defects
Josephson junction
phase qubit
74.50.+r
03.65.Yz
71.15.Mb
Online Access:https://doi.org/10.1088/1367-2630/17/2/023017

Internet

https://doi.org/10.1088/1367-2630/17/2/023017

Similar Items