Standard CMOS Process Integrated Silicon-Based Ultraviolet-Infrared Complementary Sensor

Standard CMOS Process Integrated Silicon-Based Ultraviolet-Infrared Complementary Sensor

This study proposes a new ultraviolet-infrared (UV-Ir) compatible sensor fabricated using the standard CMOS process. The concept is verified through a numerical simulation, wherein the standard CMOS process parameters used are evaluated. The proposed sensor is an extension of a previously proposed R...

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Bibliographic Details
Main Authors: Takaya Sugiura, Hiroki Miura, Nobuhiko Nakano
Format: Article
Language:English
Published: IEEE 2022-01-01
Series:IEEE Photonics Journal
Subjects:
CMOS
device simulation
infrared
ultraviolet
Online Access:https://ieeexplore.ieee.org/document/9846976/

Internet

https://ieeexplore.ieee.org/document/9846976/

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