Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices
We review the state-of-the-art in the understanding of planar NAND Flash memory reliability and discuss how the recent move to three-dimensional (3D) devices has affected this field. Particular emphasis is placed on mechanisms developing along the lifetime of the memory array, as opposed to time-zer...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2017-04-01
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| Series: | Computers |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2073-431X/6/2/16 |