Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices
We review the state-of-the-art in the understanding of planar NAND Flash memory reliability and discuss how the recent move to three-dimensional (3D) devices has affected this field. Particular emphasis is placed on mechanisms developing along the lifetime of the memory array, as opposed to time-zer...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2017-04-01
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| Series: | Computers |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2073-431X/6/2/16 |
| _version_ | 1828138813280485376 |
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| author | Alessandro S. Spinelli Christian Monzio Compagnoni Andrea L. Lacaita |
| author_facet | Alessandro S. Spinelli Christian Monzio Compagnoni Andrea L. Lacaita |
| author_sort | Alessandro S. Spinelli |
| collection | DOAJ |
| description | We review the state-of-the-art in the understanding of planar NAND Flash memory reliability and discuss how the recent move to three-dimensional (3D) devices has affected this field. Particular emphasis is placed on mechanisms developing along the lifetime of the memory array, as opposed to time-zero or technological issues, and the viewpoint is focused on the understanding of the root causes. The impressive amount of published work demonstrates that Flash reliability is a complex yet well-understood field, where nonetheless tighter and tighter constraints are set by device scaling. Three-dimensional NAND have offset the traditional scaling scenario, leading to an improvement in performance and reliability while raising new issues to be dealt with, determined by the newer and more complex cell and array architectures as well as operation modes. A thorough understanding of the complex phenomena involved in the operation and reliability of NAND cells remains vital for the development of future technology nodes. |
| first_indexed | 2024-04-11T18:43:18Z |
| format | Article |
| id | doaj.art-b91bd791614e423aa4382a3c4878970c |
| institution | Directory Open Access Journal |
| issn | 2073-431X |
| language | English |
| last_indexed | 2024-04-11T18:43:18Z |
| publishDate | 2017-04-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Computers |
| spelling | doaj.art-b91bd791614e423aa4382a3c4878970c2022-12-22T04:08:56ZengMDPI AGComputers2073-431X2017-04-01621610.3390/computers6020016computers6020016Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D DevicesAlessandro S. Spinelli0Christian Monzio Compagnoni1Andrea L. Lacaita2Dipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, 20133 Milano, ItalyDipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, 20133 Milano, ItalyDipartimento di Elettronica, Informazione e Bioingegneria, Politecnico di Milano, 20133 Milano, ItalyWe review the state-of-the-art in the understanding of planar NAND Flash memory reliability and discuss how the recent move to three-dimensional (3D) devices has affected this field. Particular emphasis is placed on mechanisms developing along the lifetime of the memory array, as opposed to time-zero or technological issues, and the viewpoint is focused on the understanding of the root causes. The impressive amount of published work demonstrates that Flash reliability is a complex yet well-understood field, where nonetheless tighter and tighter constraints are set by device scaling. Three-dimensional NAND have offset the traditional scaling scenario, leading to an improvement in performance and reliability while raising new issues to be dealt with, determined by the newer and more complex cell and array architectures as well as operation modes. A thorough understanding of the complex phenomena involved in the operation and reliability of NAND cells remains vital for the development of future technology nodes.http://www.mdpi.com/2073-431X/6/2/16Flash memoryNAND Flash reliabilityNAND Flash scaling3D NAND Flash |
| spellingShingle | Alessandro S. Spinelli Christian Monzio Compagnoni Andrea L. Lacaita Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices Computers Flash memory NAND Flash reliability NAND Flash scaling 3D NAND Flash |
| title | Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices |
| title_full | Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices |
| title_fullStr | Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices |
| title_full_unstemmed | Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices |
| title_short | Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices |
| title_sort | reliability of nand flash memories planar cells and emerging issues in 3d devices |
| topic | Flash memory NAND Flash reliability NAND Flash scaling 3D NAND Flash |
| url | http://www.mdpi.com/2073-431X/6/2/16 |
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