Tunnel Lining Multi-Defect Detection Based on an Improved You Only Look Once Version 7 Algorithm

In the domain of tunnel lining defect detection, object detection algorithms have been widely employed. However, existing algorithms suffer from inadequate extraction of global information and low detection accuracy. To address these issues, a novel algorithm called Tunnel Defect Detection You Only...

Full description

Bibliographic Details
Main Authors: Song Juan, He Long-Xi, Long Hui-Ping
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10310201/