Column-Parallel Correlated Multiple Sampling Circuits for CMOS Image Sensors and Their Noise Reduction Effects

Column-Parallel Correlated Multiple Sampling Circuits for CMOS Image Sensors and Their Noise Reduction Effects

For low-noise complementary metal-oxide-semiconductor (CMOS) image sensors, the reduction of pixel source follower noises is becoming very important. Column-parallel high-gain readout circuits are useful for low-noise CMOS image sensors. This paper presents column-parallel high-gain signal readout c...

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Bibliographic Details
Main Authors: Shoji Kawahito, Shinya Itoh, Satoshi Aoyama, Sungho Suh
Format: Article
Language:English
Published: MDPI AG 2010-10-01
Series:Sensors
Subjects:
CMOS image sensor
low noise
wide dynamic range
column-parallel correlated multiple sampling
folding integration technique
Online Access:http://www.mdpi.com/1424-8220/10/10/9139/

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http://www.mdpi.com/1424-8220/10/10/9139/

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