Epitaxial growth and characterization of Bi1−xSbx thin films on (0001) sapphire substrates

Epitaxial growth and characterization of Bi1−xSbx thin films on (0001) sapphire substrates

We report the molecular beam epitaxy of Bi1−xSbx thin films (0 ≤ x ≤ 1) on sapphire (0001) substrates using a thin (Bi,Sb)2Te3 buffer layer. The characterization of the films using reflection high energy diffraction, x-ray diffraction, atomic force microscopy, and scanning transmission electron micr...

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Bibliographic Details
Main Authors: Yu-Sheng Huang, Saurav Islam, Yongxi Ou, Supriya Ghosh, Anthony Richardella, K. Andre Mkhoyan, Nitin Samarth
Format: Article
Language:English
Published: AIP Publishing LLC 2024-02-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/5.0190217

Internet

http://dx.doi.org/10.1063/5.0190217

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