Double edge resolving set and exchange property for nanosheet structure

The exploration of edge metric dimension and its applications has been an ongoing discussion, particularly in the context of nanosheet graphs formed from the octagonal grid. Edge metric dimension is a concept that involves uniquely identifying the entire edge set of a structure with a selected subse...

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Bibliographic Details
Main Authors: Ali N.A. Koam, Ali Ahmad, Sikander Ali, Muhammad Kamran Jamil, Muhammad Azeem
Format: Article
Language:English
Published: Elsevier 2024-03-01
Series:Heliyon
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2405844024030238