Electrostatic pull-in application in flexible devices: A review

The electrostatic pull-in effect is a common phenomenon and a key parameter in the design of microscale and nanoscale devices. Flexible electronic devices based on the pull-in effect have attracted increasing attention due to their unique ductility. This review summarizes nanoelectromechanical switc...

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Bibliographic Details
Main Authors: Teng Cai, Yuming Fang, Yingli Fang, Ruozhou Li, Ying Yu, Mingyang Huang
Format: Article
Language:English
Published: Beilstein-Institut 2022-04-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.13.32