Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions

Extreme Path Delay Estimation of Critical Paths in Within-Die Process Fluctuations Using Multi-Parameter Distributions

Two multi-parameter distributions, namely the Pearson type IV and metalog distributions, are discussed and suggested as alternatives to the normal distribution for modelling path delay data that determines the maximum clock frequency (FMAX) of a microprocessor or other digital circuit. These distrib...

Full description

Bibliographic Details
Main Authors: Miikka Runolinna, Matthew Turnquist, Jukka Teittinen, Pauliina Ilmonen, Lauri Koskinen
Format: Article
Language:English
Published: MDPI AG 2023-03-01
Series:Journal of Low Power Electronics and Applications
Subjects:
process variance
Pearson distribution
metalog distribution
confidence intervals
Online Access:https://www.mdpi.com/2079-9268/13/1/22

Internet

https://www.mdpi.com/2079-9268/13/1/22

Similar Items