Depth-resolved magnetization profile of MgO/CoFeB/W perpendicular half magnetic tunnel junctions
In this work, we used the soft X-ray resonant magnetic reflectivity to study the depth-resolved out-of-plane (oop) magnetization profile of a CoFeB/MgO sample with W/Ta cap layer after annealing at 400°C. It is a powerful technique to probe buried magnetic interfaces of ultra-thin films by combining...
| Autori principali: | , , , , , , , , |
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| Natura: | Articolo |
| Lingua: | English |
| Pubblicazione: |
AIP Publishing LLC
2022-03-01
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| Serie: | AIP Advances |
| Accesso online: | http://dx.doi.org/10.1063/9.0000343 |