Computer vision distortion correction of scanning probe microscopy images

Computer vision distortion correction of scanning probe microscopy images

Abstract Since its inception, scanning probe microscopy (SPM) has established itself as the tool of choice for probing surfaces and functionalities at the nanoscale. Although recent developments in the instrumentation have greatly improved the metrological aspects of SPM, it is still plagued by the...

Full description

Bibliographic Details
Main Authors: Iaroslav Gaponenko, Philippe Tückmantel, Benedikt Ziegler, Guillaume Rapin, Manisha Chhikara, Patrycja Paruch
Format: Article
Language:English
Published: Nature Portfolio 2017-04-01
Series:Scientific Reports
Online Access:https://doi.org/10.1038/s41598-017-00765-w

Similar Items

Similar Items