A BIST Scheme for Dynamic Comparators
This paper proposes a built-in self-test (BIST) scheme for detecting catastrophic faults in dynamic comparators. In this scheme, a feedback loop is designed using the characteristics of the comparator; monitoring the voltage in the feedback loop can determine the presence of a circuit fault. The pro...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2022-12-01
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| Series: | Electronics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2079-9292/11/24/4169 |