Electron backscatter diffraction in the silicon nanowires
In this paper we consider the formation on the surface of silicon by metal-induced chemical etching, the silicon nanowires and the study of their electron (SEM) and (TEM) microscopy, X-ray diffraction (EDX) analysis and electron backscatter diffraction (EBDS) in nanowires. Combination of field emiss...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Al-Farabi Kazakh National University
2016-10-01
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| Series: | Physical Sciences and Technology |
| Subjects: | |
| Online Access: | http://phst/index.php/journal/article/view/65 |