Valence band offset of wurtzite InN/SrTiO<sub>3 </sub>heterojunction measured by x-ray photoelectron spectroscopy
<p>Abstract</p> <p>The valence band offset (VBO) of wurtzite indium nitride/strontium titanate (InN/SrTiO<sub>3</sub>) heterojunction has been directly measured by x-ray photoelectron spectroscopy. The VBO is determined to be 1.26 ± 0.23 eV and the conduction b...
| Main Authors: | , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2011-01-01
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| Series: | Nanoscale Research Letters |
| Online Access: | http://www.nanoscalereslett.com/content/6/1/193 |