Using the Size Strain Plot Method to Specity Lattice Parameters
X-ray diffractometers deliver the best quality diffraction data while being easy to use and adaptable to various applications. When X-ray photons strike electrons in materials, the incident photons scatter in a direction different from the incident beam; if the scattered beams do not change in wavel...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
University of Baghdad
2023-01-01
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| Series: | Ibn Al-Haitham Journal for Pure and Applied Sciences |
| Subjects: | |
| Online Access: | https://jih.uobaghdad.edu.iq/index.php/j/article/view/2891 |