Conduction mechanisms in thin (0.6)BiFeO3-(0.4)PbTiO3 films

Conduction mechanisms in thin (0.6)BiFeO3-(0.4)PbTiO3 films

Leakage current is one of the major drawbacks for a proper electrical and dielectric characterization limiting applications of ferroelectric materials, especially considering thin films. In this sense, understanding the leakage current mechanisms in such systems is of utmost importance. Herein, high...

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Bibliographic Details
Main Authors: E.A.C. Astrath, E.A. Volnistem, R.C. Oliveira, R.R. Barbosa, A.J. Santana, A.C. Ferreira, D.M. Silva, G.S. Dias, L.F. Cótica, I.A. Santos, L.C. Dias, T.G.M. Bonadio, V.F. Freitas
Format: Article
Language:English
Published: Elsevier 2022-03-01
Series:Journal of Materials Research and Technology
Subjects:
Pechini route
Multiferroic thin film
Ferroelectrics
Electric properties
Online Access:http://www.sciencedirect.com/science/article/pii/S2238785422001946

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http://www.sciencedirect.com/science/article/pii/S2238785422001946

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