Unleashing Parallelism With Minimal Test Inflation in Multi-Threaded Test Pattern Generation
Shared-memory systems enable parallel computing for the automatic test pattern generation (ATPG). Although the existing techniques for parallel ATPG reach near-linear speedup, test inflation becomes a common problem in its practicality. Therefore, this paper proposes a multi-threaded test pattern ge...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2018-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8456510/ |