Probing molecular orientations in thin films by x-ray photoelectron spectroscopy
A great number of functional organic molecules in active thin-film layers of optoelectronic devices have highly asymmetric structures, such as plate-like, rod-like, etc. This makes molecular orientation an important aspect in thin-films as it can significantly affect both the optical and electrical...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2018-03-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5025175 |
| _version_ | 1811272045579730944 |
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| author | Y. Li P. Li Z.-H. Lu |
| author_facet | Y. Li P. Li Z.-H. Lu |
| author_sort | Y. Li |
| collection | DOAJ |
| description | A great number of functional organic molecules in active thin-film layers of optoelectronic devices have highly asymmetric structures, such as plate-like, rod-like, etc. This makes molecular orientation an important aspect in thin-films as it can significantly affect both the optical and electrical performance of optoelectronic devices. With a combination of in-situ ultra violet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS) investigations for organic molecules having a broad range of structural properties, we discovered a rigid connection of core levels and frontier highest occupied molecular orbital levels at organic interfaces. This finding opens up opportunities of using X-ray photoemission spectroscopy as an alternative tool to UPS for providing an easy and unambiguous data interpretation in probing molecular orientations. |
| first_indexed | 2024-04-12T22:32:03Z |
| format | Article |
| id | doaj.art-bd40123763a449248134d560da945fa0 |
| institution | Directory Open Access Journal |
| issn | 2158-3226 |
| language | English |
| last_indexed | 2024-04-12T22:32:03Z |
| publishDate | 2018-03-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | AIP Advances |
| spelling | doaj.art-bd40123763a449248134d560da945fa02022-12-22T03:13:56ZengAIP Publishing LLCAIP Advances2158-32262018-03-0183035218035218-610.1063/1.5025175082803ADVProbing molecular orientations in thin films by x-ray photoelectron spectroscopyY. Li0P. Li1Z.-H. Lu2Department of Materials Science and Engineering, University of Toronto, 184 College Street, Toronto, Ontario M5S 3E4, CanadaDepartment of Materials Science and Engineering, University of Toronto, 184 College Street, Toronto, Ontario M5S 3E4, CanadaDepartment of Materials Science and Engineering, University of Toronto, 184 College Street, Toronto, Ontario M5S 3E4, CanadaA great number of functional organic molecules in active thin-film layers of optoelectronic devices have highly asymmetric structures, such as plate-like, rod-like, etc. This makes molecular orientation an important aspect in thin-films as it can significantly affect both the optical and electrical performance of optoelectronic devices. With a combination of in-situ ultra violet photoelectron spectroscopy (UPS) and x-ray photoelectron spectroscopy (XPS) investigations for organic molecules having a broad range of structural properties, we discovered a rigid connection of core levels and frontier highest occupied molecular orbital levels at organic interfaces. This finding opens up opportunities of using X-ray photoemission spectroscopy as an alternative tool to UPS for providing an easy and unambiguous data interpretation in probing molecular orientations.http://dx.doi.org/10.1063/1.5025175 |
| spellingShingle | Y. Li P. Li Z.-H. Lu Probing molecular orientations in thin films by x-ray photoelectron spectroscopy AIP Advances |
| title | Probing molecular orientations in thin films by x-ray photoelectron spectroscopy |
| title_full | Probing molecular orientations in thin films by x-ray photoelectron spectroscopy |
| title_fullStr | Probing molecular orientations in thin films by x-ray photoelectron spectroscopy |
| title_full_unstemmed | Probing molecular orientations in thin films by x-ray photoelectron spectroscopy |
| title_short | Probing molecular orientations in thin films by x-ray photoelectron spectroscopy |
| title_sort | probing molecular orientations in thin films by x ray photoelectron spectroscopy |
| url | http://dx.doi.org/10.1063/1.5025175 |
| work_keys_str_mv | AT yli probingmolecularorientationsinthinfilmsbyxrayphotoelectronspectroscopy AT pli probingmolecularorientationsinthinfilmsbyxrayphotoelectronspectroscopy AT zhlu probingmolecularorientationsinthinfilmsbyxrayphotoelectronspectroscopy |