Curvature Detection with an Optoelectronic Measurement System Using a Self-Made Calibration Profile

Curvature Detection with an Optoelectronic Measurement System Using a Self-Made Calibration Profile

So far, no studies of material deformations (e.g., bending of sports equipment) have been performed to measure the curvature (w″) using an optoelectronic measurement system OMS. To test the accuracy of the w″ measurement with an OMS (Qualisys), a calibration profile which allowed to: (i) differentia...

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Bibliographic Details
Main Authors: Christoph Thorwartl, Thomas Stöggl, Wolfgang Teufl, Helmut Holzer, Josef Kröll
Format: Article
Language:English
Published: MDPI AG 2021-12-01
Series:Sensors
Subjects:
accuracy
calibration profile
curvature
motion capture
Online Access:https://www.mdpi.com/1424-8220/22/1/51

Internet

https://www.mdpi.com/1424-8220/22/1/51

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