Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners
<p>The miniaturisation of components leads to new demands on measurement systems. One of these is the resolution. As a volumetric analysis method and method of non-destructive testing, industrial X-ray computed tomography (XCT) has the ability to measure geometrical features and their correspo...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Copernicus Publications
2023-01-01
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| Series: | Journal of Sensors and Sensor Systems |
| Online Access: | https://jsss.copernicus.org/articles/12/1/2023/jsss-12-1-2023.pdf |
| _version_ | 1797955233221967872 |
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| author | M. Busch T. Hausotte |
| author_facet | M. Busch T. Hausotte |
| author_sort | M. Busch |
| collection | DOAJ |
| description | <p>The miniaturisation of components leads to new demands on
measurement systems. One of these is the resolution. As a volumetric analysis
method and method of non-destructive testing, industrial X-ray computed
tomography (XCT) has the ability to measure geometrical features and their
corresponding dimensions without destroying them and can therefore be used for
quality assurance. However, the concept of resolution is not trivial for XCT
and has not yet been finally clarified. In particular, the interface structural
resolution, the detectability of two surfaces facing each other after
surface segmentation, faces a lack of a test specimen, a corresponding
measurand and a reliable method. Simulation-based XCT investigations of a
method to determine this type of resolution are presented in this article
using the geometry of a test specimen that contains several radially
arranged holes of the same size. The borehole diameters correspond to the
distance between the holes to investigate the resolvability of surfaces and
interfaces. The evaluation is based on mean and extreme values of grey value
profiles between the individual boreholes of the reconstructed volume. It is
shown that the geometrical detectability of the test specimen surface and
interface can be extended by a reasonable choice of the threshold value for
surface segmentation within a defined interval. With regard to the resolving
capability, a distinction is made between assured detectability and possible
detectability, as well as the threshold value used when using the ISO50
threshold for surface segmentation and measurement chain completion.</p> |
| first_indexed | 2024-04-10T23:30:01Z |
| format | Article |
| id | doaj.art-bdaab1be6cc64b56ac17a23c974b6632 |
| institution | Directory Open Access Journal |
| issn | 2194-8771 2194-878X |
| language | English |
| last_indexed | 2024-04-10T23:30:01Z |
| publishDate | 2023-01-01 |
| publisher | Copernicus Publications |
| record_format | Article |
| series | Journal of Sensors and Sensor Systems |
| spelling | doaj.art-bdaab1be6cc64b56ac17a23c974b66322023-01-12T07:02:16ZengCopernicus PublicationsJournal of Sensors and Sensor Systems2194-87712194-878X2023-01-01121810.5194/jsss-12-1-2023Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scannersM. BuschT. Hausotte<p>The miniaturisation of components leads to new demands on measurement systems. One of these is the resolution. As a volumetric analysis method and method of non-destructive testing, industrial X-ray computed tomography (XCT) has the ability to measure geometrical features and their corresponding dimensions without destroying them and can therefore be used for quality assurance. However, the concept of resolution is not trivial for XCT and has not yet been finally clarified. In particular, the interface structural resolution, the detectability of two surfaces facing each other after surface segmentation, faces a lack of a test specimen, a corresponding measurand and a reliable method. Simulation-based XCT investigations of a method to determine this type of resolution are presented in this article using the geometry of a test specimen that contains several radially arranged holes of the same size. The borehole diameters correspond to the distance between the holes to investigate the resolvability of surfaces and interfaces. The evaluation is based on mean and extreme values of grey value profiles between the individual boreholes of the reconstructed volume. It is shown that the geometrical detectability of the test specimen surface and interface can be extended by a reasonable choice of the threshold value for surface segmentation within a defined interval. With regard to the resolving capability, a distinction is made between assured detectability and possible detectability, as well as the threshold value used when using the ISO50 threshold for surface segmentation and measurement chain completion.</p>https://jsss.copernicus.org/articles/12/1/2023/jsss-12-1-2023.pdf |
| spellingShingle | M. Busch T. Hausotte Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners Journal of Sensors and Sensor Systems |
| title | Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners |
| title_full | Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners |
| title_fullStr | Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners |
| title_full_unstemmed | Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners |
| title_short | Simulation-based investigation of the metrological interface structural resolution capability of X-ray computed tomography scanners |
| title_sort | simulation based investigation of the metrological interface structural resolution capability of x ray computed tomography scanners |
| url | https://jsss.copernicus.org/articles/12/1/2023/jsss-12-1-2023.pdf |
| work_keys_str_mv | AT mbusch simulationbasedinvestigationofthemetrologicalinterfacestructuralresolutioncapabilityofxraycomputedtomographyscanners AT thausotte simulationbasedinvestigationofthemetrologicalinterfacestructuralresolutioncapabilityofxraycomputedtomographyscanners |