Thermal and Mechanical Properties of Amorphous Silicon Carbide Thin Films Using the Femtosecond Pump-Probe Technique
Nanoscale amorphous silicon carbide (a-SiC) thin films are widely used in engineering applications. It is important to obtain accurate information about their material properties because they often differ from those of the bulk state depending on the fabrication technique and process parameters. In...
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| Format: | Article |
| Language: | English |
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MDPI AG
2022-03-01
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| Series: | Materials |
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| Online Access: | https://www.mdpi.com/1996-1944/15/6/2165 |