A Novel Framework for Semiconductor Manufacturing Final Test Yield Classification Using Machine Learning Techniques

A Novel Framework for Semiconductor Manufacturing Final Test Yield Classification Using Machine Learning Techniques

Advanced data analysis tools and techniques are important for semiconductor companies to gain competitive advantage. In particular, yield prediction tools, which fully utilize production data, help to improve operational efficiency and reduce production costs. This paper introduces a novel and scala...

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Bibliographic Details
Main Authors: Dan Jiang, Weihua Lin, Nagarajan Raghavan
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Semiconductor manufacturing
smart manufacturing
yield prediction
final test
Gaussian mixture models
clustering
Online Access:https://ieeexplore.ieee.org/document/9244159/

Internet

https://ieeexplore.ieee.org/document/9244159/

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