Optimization of Tunnel Field-Effect Transistor-Based ESD Protection Network

The tunnel field-effect transistor (TFET) is a potential candidate for replacing the reverse diode and providing a secondary path in a whole-chip electrostatic discharge (ESD) protection network. In this paper, the ESD characteristics of a traditional point TFET, a line TFET and a Ge-source TFET are...

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Bibliographic Details
Main Authors: Zhihua Zhu, Zhaonian Yang, Xiaomei Fan, Yingtao Zhang, Juin Jei Liou, Wenbing Fan
Format: Article
Language:English
Published: MDPI AG 2021-01-01
Series:Crystals
Subjects:
Online Access:https://www.mdpi.com/2073-4352/11/2/128