Simulation of XRD, Raman and IR spectrum for phase identification in doped HfO2 and ZrO2

Fluorite-structured hafnium and zirconia require different, complementary characterization methods to identify the numerous metastable phases. This is because of the many possible positions of the oxygen ions, which are difficult to observe directly. Ab initio simulations are useful to probe the cor...

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Bibliographic Details
Main Authors: Alfred Kersch, Richard Ganser, Maximilian Trien
Format: Article
Language:English
Published: Frontiers Media S.A. 2022-11-01
Series:Frontiers in Nanotechnology
Subjects:
Online Access:https://www.frontiersin.org/articles/10.3389/fnano.2022.1026286/full