Improvement of Retention Characteristics Using Doped SiN Layer Between WL Spaces in 3D NAND Flash
We propose a novel structure of a charge trapping layer, that is doped between Word Line(WL) spaces in 3D NAND flash memory. To estimate the retention characteristics, the <inline-formula> <tex-math notation="LaTeX">$\Delta \text{V}_{\mathrm {th}}$ </tex-math></inline-...
Main Authors: | Hyewon Kyung, Yunejae Suh, Youngho Jung, Daewoong Kang |
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Format: | Article |
Language: | English |
Published: |
IEEE
2024-01-01
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Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10478720/ |
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