High Linearity Synaptic Devices Using Ar Plasma Treatment on HfO<sub>2</sub> Thin Film with Non-Identical Pulse Waveforms
We enhanced the device uniformity for reliable memory performances by increasing the device surface roughness by exposing the HfO<sub>2</sub> thin film surface to argon (Ar) plasma. The results showed significant improvements in electrical and synaptic properties, including memory window...
Main Authors: | , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2022-09-01
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Series: | Nanomaterials |
Subjects: | |
Online Access: | https://www.mdpi.com/2079-4991/12/18/3252 |