Updating the relationship of the Ne/ERN to task-related behavior: A brief review and suggestions for future research
The error negativity/error-related negativity (Ne/ERN) is one of the most well-studied event-related potential (ERP) components in the electroencephalography (EEG) literature. Peaking about 50 ms after the commission of an error, the Ne/ERN is a negative deflection in the ERP waveform that is though...
Main Authors: | , , , , , |
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Format: | Article |
Language: | English |
Published: |
Frontiers Media S.A.
2023-04-01
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Series: | Frontiers in Human Neuroscience |
Subjects: | |
Online Access: | https://www.frontiersin.org/articles/10.3389/fnhum.2023.1150244/full |