Updating the relationship of the Ne/ERN to task-related behavior: A brief review and suggestions for future research

The error negativity/error-related negativity (Ne/ERN) is one of the most well-studied event-related potential (ERP) components in the electroencephalography (EEG) literature. Peaking about 50 ms after the commission of an error, the Ne/ERN is a negative deflection in the ERP waveform that is though...

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Bibliographic Details
Main Authors: Sara B. LoTemplio, Clara Louise Lopes, Amy S. McDonnell, Emily E. Scott, Brennan R. Payne, David L. Strayer
Format: Article
Language:English
Published: Frontiers Media S.A. 2023-04-01
Series:Frontiers in Human Neuroscience
Subjects:
Online Access:https://www.frontiersin.org/articles/10.3389/fnhum.2023.1150244/full