Whale Optimization Algorithm-Based Parallel Computing for Accelerating Misalignment Estimation of Reflective Fourier Ptychography Microscopy
Reflective Fourier ptychographic microscopy has much potential for industrial surface inspection due to the ability to overcome the physical limits of the numerical aperture of the optical microscopy. However, the time cost for misalignment calibration and Fourier ptychography (FP) recovery has been...
Main Authors: | , , |
---|---|
Format: | Article |
Language: | English |
Published: |
IEEE
2023-01-01
|
Series: | IEEE Photonics Journal |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/10034818/ |