Whale Optimization Algorithm-Based Parallel Computing for Accelerating Misalignment Estimation of Reflective Fourier Ptychography Microscopy

Reflective Fourier ptychographic microscopy has much potential for industrial surface inspection due to the ability to overcome the physical limits of the numerical aperture of the optical microscopy. However, the time cost for misalignment calibration and Fourier ptychography (FP) recovery has been...

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Bibliographic Details
Main Authors: Van Huan Pham, Byong Hyuk Chon, Hee Kyung Ahn
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/10034818/

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