Strain-Induced asymmetry and on-site dynamics of silicon defects in graphene

Strain-Induced asymmetry and on-site dynamics of silicon defects in graphene

In the last decade, the atomically-focused electron beams utilized in scanning transmission electron microscopes (STEMs) have been shown to induce a broad set of local structural transformations in materials, opening pathways for directing material synthesis and modification atom-by-atom. The mechan...

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Bibliographic Details
Main Authors: Ondrej Dyck, Feng Bao, Maxim Ziatdinov, Ali Yousefzadi Nobakht, Kody Law, Artem Maksov, Bobby G. Sumpter, Richard Archibald, Stephen Jesse, Sergei V. Kalinin, David B. Lingerfelt
Format: Article
Language:English
Published: Elsevier 2022-10-01
Series:Carbon Trends
Subjects:
On-site asymmetry
Symmetry breaking
Strain engineering
Strain-induced phenomena
Defect dynamics
Defect microanalysis
Online Access:http://www.sciencedirect.com/science/article/pii/S2667056922000451

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http://www.sciencedirect.com/science/article/pii/S2667056922000451

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