On the Use of Focused Incident Near-Field Beams in Microwave Imaging

On the Use of Focused Incident Near-Field Beams in Microwave Imaging

We consider the use of focused incident near-field (NF) beams to interrogate the object of interest (OI) in NF microwave imaging (MWI). To this end, we first discuss how focused NF beams can be advantageously utilized to suppress scattering effects from the neighbouring objects whose unknown dielect...

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Bibliographic Details
Main Authors: Nozhan Bayat, Puyan Mojabi
Format: Article
Language:English
Published: MDPI AG 2018-09-01
Series:Sensors
Subjects:
microwave imaging (MWI)
near-field (NF) zone
sub-wavelength focusing
near-field plates
Bessel beams
inverse scattering
inverse source problems
Online Access:http://www.mdpi.com/1424-8220/18/9/3127

Internet

http://www.mdpi.com/1424-8220/18/9/3127

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