Protocol for nanoscale thermal mapping of electronic devices using atomic force microscopy with phase change material
Summary: In this protocol, we present a facile nanoscale thermal mapping technique for electronic devices by use of atomic force microscopy and a phase change material Ge2Sb2Te5. We describe steps for Ge2Sb2Te5 thin film coating, Ge2Sb2Te5 temperature calibration, thermal mapping by varying heater p...
Auteurs principaux: | Qilong Cheng, Sukumar Rajauria, Erhard Schreck, Robert Smith, Na Wang, Jim Reiner, Qing Dai, David Bogy |
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Format: | Article |
Langue: | English |
Publié: |
Elsevier
2024-06-01
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Collection: | STAR Protocols |
Sujets: | |
Accès en ligne: | http://www.sciencedirect.com/science/article/pii/S2666166724002041 |
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