Model Order Selection for Short Data: An Exponential Fitting Test (EFT)
<p/> <p>High-resolution methods for estimating signal processing parameters such as bearing angles in array processing or frequencies in spectral analysis may be hampered by the model order if poorly selected. As classical model order selection methods fail when the number of snapshots a...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2007-01-01
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| Series: | EURASIP Journal on Advances in Signal Processing |
| Online Access: | http://asp.eurasipjournals.com/content/2007/071953 |