Extending the Depth of Field beyond Geometrical Imaging Limitations Using Phase Noise as a Focus Measure in Multiwavelength Digital Holography

Extending the Depth of Field beyond Geometrical Imaging Limitations Using Phase Noise as a Focus Measure in Multiwavelength Digital Holography

Digital holography is a well-established technology for optical quality control in industrial applications. Two common challenges in digital holographic measurement tasks are the ambiguity at phase steps and the limited depth of focus. With multiwavelength holography, multiple artificial wavelengths...

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Bibliographic Details
Main Authors: Tobias Seyler, Markus Fratz, Tobias Beckmann, Annelie Schiller, Alexander Bertz, Daniel Carl
Format: Article
Language:English
Published: MDPI AG 2018-06-01
Series:Applied Sciences
Subjects:
multi-wavelength holography
inline measurement
shape-from-focus
phase noise
gear measurement
all-in-focus
Online Access:http://www.mdpi.com/2076-3417/8/7/1042

Internet

http://www.mdpi.com/2076-3417/8/7/1042

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