Fast Localization of Small Inhomogeneities from Far-Field Pattern Data in the Limited-Aperture Inverse Scattering Problem

Fast Localization of Small Inhomogeneities from Far-Field Pattern Data in the Limited-Aperture Inverse Scattering Problem

In this study, we consider a sampling-type algorithm for the fast localization of small electromagnetic inhomogeneities from measured far-field pattern data in the limited-aperture inverse scattering problem. For this purpose, we designed an indicator function based on the structure of left- and rig...

Deskribapen osoa

Xehetasun bibliografikoak
Egile nagusia: Won-Kwang Park
Formatua: Artikulua
Hizkuntza:English
Argitaratua: MDPI AG 2021-08-01
Saila:Mathematics
Gaiak:
fast localization
sampling-type algorithm
small electromagnetic inhomogeneities
multistatic response matrix
simulation results
Sarrera elektronikoa:https://www.mdpi.com/2227-7390/9/17/2087

Internet

https://www.mdpi.com/2227-7390/9/17/2087

Antzeko izenburuak