Fast Localization of Small Inhomogeneities from Far-Field Pattern Data in the Limited-Aperture Inverse Scattering Problem
In this study, we consider a sampling-type algorithm for the fast localization of small electromagnetic inhomogeneities from measured far-field pattern data in the limited-aperture inverse scattering problem. For this purpose, we designed an indicator function based on the structure of left- and rig...
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| Format: | Article |
| Language: | English |
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MDPI AG
2021-08-01
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| Series: | Mathematics |
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| Online Access: | https://www.mdpi.com/2227-7390/9/17/2087 |