Photoemission sources and beam blankers for ultrafast electron microscopy
Observing atomic motions as they occur is the dream goal of ultrafast electron microscopy (UEM). Great progress has been made so far thanks to the efforts of many scientists in developing the photoemission sources and beam blankers needed to create short pulses of elect...
Main Authors: | , , , |
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Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC and ACA
2019-09-01
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Series: | Structural Dynamics |
Online Access: | http://dx.doi.org/10.1063/1.5117058 |