Photoemission sources and beam blankers for ultrafast electron microscopy

Observing atomic motions as they occur is the dream goal of ultrafast electron microscopy (UEM). Great progress has been made so far thanks to the efforts of many scientists in developing the photoemission sources and beam blankers needed to create short pulses of elect...

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Bibliographic Details
Main Authors: Lixin Zhang, Jacob P. Hoogenboom, Ben Cook, Pieter Kruit
Format: Article
Language:English
Published: AIP Publishing LLC and ACA 2019-09-01
Series:Structural Dynamics
Online Access:http://dx.doi.org/10.1063/1.5117058