Genome-wide association study for grain yield and related traits in elite wheat varieties and advanced lines using SNP markers.

Genome-wide association study for grain yield and related traits in elite wheat varieties and advanced lines using SNP markers.

Genetic improvement of grain yield is always an important objective in wheat breeding. Here, a genome-wide association study was conducted to parse the complex genetic composition of yield-related traits of 105 elite wheat varieties (lines) using the Wheat 90K Illumina iSelect SNP array. Nine yield-...

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Bibliographic Details
Main Authors: Sheng-Xing Wang, Yu-Lei Zhu, De-Xin Zhang, Hui Shao, Peng Liu, Jian-Bang Hu, Heng Zhang, Hai-Ping Zhang, Cheng Chang, Jie Lu, Xian-Chun Xia, Gen-Lou Sun, Chuan-Xi Ma
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2017-01-01
Series:PLoS ONE
Online Access:http://europepmc.org/articles/PMC5703539?pdf=render

Internet

http://europepmc.org/articles/PMC5703539?pdf=render

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