Self-Consistent Enhanced S/D Tunneling Implementation in a 2D MS-EMC Nanodevice Simulator

The implementation of a source to drain tunneling in ultrascaled devices using MS-EMC has traditionally led to overestimated current levels in the subthreshold regime. In order to correct this issue and enhance the capabilities of this type of simulator, we discuss in this paper two alternative and...

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Bibliographic Details
Main Authors: Cristina Medina-Bailon, José Luis Padilla, Carlos Sampedro, Luca Donetti, Vihar P. Gergiev, Francisco Gamiz, Asen Asenov
Format: Article
Language:English
Published: MDPI AG 2021-05-01
Series:Micromachines
Subjects:
Online Access:https://www.mdpi.com/2072-666X/12/6/601