Weak and Strong Non-Robust Tests for Functionally Possible Path Delay Faults
Small delay defects are caused by fabrication imperfections as well as chip aging, and detected by tests for path delay faults. Path delay faults that can cause failures during functional operation are especially important to detect. Such path delay faults are referred to as functionally possible or...
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| Format: | Article |
| Language: | English |
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IEEE
2024-01-01
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| Series: | IEEE Access |
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| Online Access: | https://ieeexplore.ieee.org/document/10734085/ |