Planar Hall effect in c-axis textured films of Bi85Sb15 topological insulator

Measurements of the planar Hall effect (PHE) and anisotropic magnetoresistance (AMR) in polycrystalline films of topological insulator Bi85Sb15 are reported. The observation of PHE and AMR in these films of carrier density ≈2 × 1019 electrons/cm3 is like the behavior of in-plane field transport in t...

Full description

Bibliographic Details
Main Authors: Ramesh C. Budhani, Joshua S. Higgins, Deandre McAlmont, Johnpierre Paglione
Format: Article
Language:English
Published: AIP Publishing LLC 2021-05-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0049577