The development of laser-produced plasma EUV light source
Extreme ultraviolet lithography (EUVL) has been demonstrated to meet the industrial requirements of new-generation semiconductor fabrication. The development of high-power EUV sources is a long-term critical challenge to the implementation of EUVL in high-volume manufacturing (HVM), together with ot...
Main Authors: | , , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
Elsevier
2022-09-01
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Series: | Chip |
Subjects: | |
Online Access: | http://www.sciencedirect.com/science/article/pii/S270947232200017X |