Resolution Enhanced Array ECT Probe for Small Defects Inspection

It is a continual and challenging problem to detect small defects in metallic structures for array eddy current testing (ECT) probes, which require the probe to have ultra-high resolution and sensitivity. However, the spatial resolution of an ECT array probe is limited by the size of the induction c...

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Bibliographic Details
Main Authors: Cai Long, Na Zhang, Xinchen Tao, Yu Tao, Chaofeng Ye
Format: Article
Language:English
Published: MDPI AG 2023-02-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/23/4/2070